IEC TS 62228:2007 pdfダウンロード
IEC TS 62228:2007 pdfダウンロード。Integrated circuits – EMC evaluation of CAN transceivers
1 Scope
This document specifies test and measurement methods, test conditions, test setups, test procedures, failure criteria and test signals for the EMC evaluation of CAN transceivers concerning:
• the immunity against RF common mode disturbances on the signal lines,
• the emissions caused by non-symmetrical signals regarding the time and frequency domain,
• the immunity against transients (function and damage), and
• the immunity against electrostatic discharges – ESD (damage).
All measurements and functional tests except ESD are performed in a small (three transceiver) network. For ESD damage tests a single transceiver configuration on a special test board is used.
External protection circuits are not applied during the tests in order to get results for the transceiver IC only.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
IEC 61 967 (all parts), Integrated circuits – Measurement of electromagnetic emissions,150 kHz to 1 GHz
IEC 61 967-4, Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 Ω /150 Ω direct coupling method
IEC 621 32 (all parts), Integrated circuits – Measurement of electromagnetic immunity, 150 kHz to 1 GHz
IEC 621 32-1 , Integrated circuits – Measurement of electromagnetic immunity, 150 kHz to 1 GHz – Part 1: General conditions and definitions
IEC 621 32-4, Integrated circuits –Measurement of electromagnetic immunity 150 kHz to 1 GHz – Part 4: Direct RF Power Injection Method
IEC 61 000-4-2:1 995, Electromagnetic compatibility – Part 4: Testing and measurement techniques – Section 2: Electrostatic discharge immunity test 1)
Amendment 1 (1 998)
Amendment 2 (2000)
ISO 7637-2: 2004, Road vehicles – Electrical disturbances from conduction and coupling – Part 2: Electrical transient conduction along supply lines only
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